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ATOM : X‐Windows‐based software for quantitative analysis of atomic images
Author(s) -
Wang S. Q.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889895005887
Subject(s) - software , computer science , fourier transform , transformation (genetics) , image processing , segmentation , resolution (logic) , atom (system on chip) , software package , noise (video) , computer graphics (images) , optics , computational science , materials science , image (mathematics) , artificial intelligence , physics , chemistry , embedded system , biochemistry , quantum mechanics , gene , programming language
A program package has been developed under an X‐Windows environment for the processing and analysis of high‐resolution atomic images. Functions of the software include image segmentation and localization, masked fast Fourier transformation, noise reduction, geometrical analysis, general image manipulation and display of two‐ or three‐dimensional crystal structures. The software can be used in the laboratory of electron microscope for structure and defect analyses of materials.