Premium
Comparison of Parasitic Scattering from Window Materials used for Small‐Angle X‐ray Scattering: a Better Beryllium Window
Author(s) -
Henderson S. J.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889895005784
Subject(s) - beryllium , scattering , materials science , kapton , small angle scattering , optics , small angle x ray scattering , window (computing) , mica , physics , composite material , nuclear physics , polyimide , layer (electronics) , computer science , operating system
The parasitic scattering of several materials used as windows in small‐angle scattering experiments, including IF‐1 beryllium, Kapton, Mylar, mica and glass has been measured over the q range 0.05–2.0 nm −1 with Cu Kα radiation ( q = 4 π sin θ / λ , 2 θ = scattering angle). Based on the criteria of high strength, high transmission and low parasitic scattering, the best material was found to be IF‐1 beryllium.