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Simultaneous Position‐Resolved Determination of Phase and Stress Distributions by means of an X‐ray Diffractometer with a Two‐Dimensional Position‐Sensitive Detector
Author(s) -
Stephan D.,
Grosse G.,
Wetzig K.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889895003839
Subject(s) - diffractometer , collimator , materials science , detector , crystallite , optics , phase (matter) , orientation (vector space) , position (finance) , powder diffractometer , diffraction , resolution (logic) , laser , image resolution , scintillator , physics , computer science , geometry , metallurgy , mathematics , scanning electron microscope , finance , quantum mechanics , artificial intelligence , economics
With an X‐ray area detector and a suitable Soller‐plate collimator in the scattered radiation field, it is possible to realize a versatile X‐ray diffractometer. The local diffraction information of a sample can be registered simultaneously and visualized with a spatial resolution better than 0.5 mm, maintaining reasonable measuring times of a few minutes. Results of measurements applied to local phase analysis (distribution of retained austenite and carbon on a cross section of case‐hardened steel), to the determination of lateral stress distributions (laser‐hardened track on C45 steel) and to the analysis of crystallite orientation (coarse‐grained YBa 2 Cu 3 O) are presented.