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Fluorescence Corrections in Thin‐Film Texture Analysis
Author(s) -
Chateigner D.,
Germi P.,
Pernet M.,
Fréchard P.,
Andrieu S.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889895001750
Subject(s) - reflection (computer programming) , texture (cosmology) , optics , fluorescence , thin film , transmission (telecommunications) , materials science , flux (metallurgy) , physics , computer science , image (mathematics) , nanotechnology , metallurgy , telecommunications , artificial intelligence , programming language
This paper reviews the transmission and reflection texture techniques in order to develop the correction formulae in each of these methods for application to fluorescent thin‐film analysis. The method is applied to iron samples deposited on glass substrates in order to prove the efficiency of these corrections in the case of the Schulz reflection geometry. The columnar growth of these films is shown to be dependent on the incident flux inclination.