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Discrete Thickness Fluctuations in Fe 3 O 4 /CoO Multilayers
Author(s) -
Neerinck D. G.,
Wolf R. M.,
Aan De Stegge J. B. F.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989401191x
Subject(s) - molecular beam epitaxy , diffraction , lattice constant , sapphire , lattice (music) , materials science , bragg's law , crystallography , epitaxy , x ray crystallography , condensed matter physics , layer (electronics) , molecular physics , chemistry , optics , physics , nanotechnology , laser , acoustics
(111)‐Fe 3 O 4 /CoO multilayers grown by molecular‐beam epitaxy, deposited on sapphire (0001) substrates, exhibit an unexpected high‐angle θ –2 θ X‐ray diffraction spectrum. The even‐order Fe 3 O 4 main Bragg peaks, nearly coinciding with the CoO Bragg peaks, clearly show multilayer splitting, whereas this is absent for the odd‐order Fe 3 O 4 peaks. This effect is shown to originate from a small discrete fluctuation of the CoO layer thickness. The system under study exemplifies the marked effect of discrete interfacial disorder in multilayers in which one of the components has a lattice parameter nearly matching twice the lattice parameter of the other component.