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The Use of a Charge‐Coupled‐Device Imaging System for X‐ray Film Intensity Measurement
Author(s) -
Grigg M. W.,
Barnea Z.
Publication year - 1996
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894011878
Subject(s) - cadmium sulfide , intensity (physics) , charge coupled device , reflection (computer programming) , charge (physics) , optics , materials science , x ray , representation (politics) , series (stratigraphy) , computational physics , optoelectronics , physics , computer science , geology , paleontology , quantum mechanics , politics , law , political science , metallurgy , programming language
The use of a simple charge‐coupled‐device‐based imaging system for digitizing an X‐ray film image is demonstrated. A method of extending the region of linear response of the film based upon an analytic representation of the observed response to a series of increasing exposures is described. The validity of the procedure is illustrated through an example of the absolute intensity measurement of a reflection of cadmium sulfide.