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Fourier Filtering of Synchrotron White‐Beam Topographs
Author(s) -
Pilard M.,
Epelboin Y.,
Soyer A.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894011076
Subject(s) - synchrotron , gibbs phenomenon , beam (structure) , fourier transform , optics , materials science , white dwarf , diffraction , piezoelectricity , fourier analysis , physics , acoustics , astrophysics , stars , quantum mechanics
Numerical image treatment has been used for the enhancement and the analysis of synchrotron white‐beam topographs. Images are recorded either during the experiment by means of an X‐ray‐sensitive camera or after the experiment from photographic films. Filters are designed to avoid artefacts such as the Gibbs effect. Filtering has been applied to the study of the propagation of surface acoustic waves in piezoelectric materials and ferromagnetic domains in Fe–Si crystals, illustrating the interest of Fourier filtering for a deep analysis of X‐ray topographs.