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Improved X‐ray and electron diffraction methods for twin determination in hexagonal crystals
Author(s) -
CheneauSpäth N.,
Fillit R. Y.,
Driver J. H.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894006758
Subject(s) - kikuchi line , macle , materials science , diffraction , crystallography , crystal twinning , electron backscatter diffraction , resolution (logic) , electron diffraction , scanning electron microscope , hexagonal crystal system , angular resolution (graph drawing) , orientation (vector space) , x ray , optics , reflection high energy electron diffraction , geometry , chemistry , microstructure , physics , composite material , computer science , mathematics , combinatorics , artificial intelligence
Two improved methods of characterizing twin orientations in deformed crystals have been developed and compared; the back‐scattered Kikuchi electron diffraction method in a standard scanning electron microscope and a new high‐resolution X‐ray pole‐figure technique. Comparative tests on titanium and magnesium crystals deformed in plane strain compression up to high strains demonstrate their complementary features. The back‐scattered Kikuchi diffraction technique, which combines imaging and microdiffraction, is well adapted to localized twin‐orientation studies in both single and polycrystals after careful surface preparation. The high‐resolution X‐ray pole figures can be used for more quantitative studies of twinned volume fractions, including very fine twins, in crystallographically oriented samples such as deformed single crystals or large‐grained polycrystals.