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Profiles in asymmetric diffraction with pseudo‐parallel‐beam geometry
Author(s) -
Toraya H.,
Yoshino J.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894006345
Subject(s) - diffraction , beam (structure) , optics , collimated light , crystal (programming language) , bragg's law , reflection (computer programming) , materials science , intensity (physics) , beam diameter , full width at half maximum , spectrum analyzer , physics , laser beams , laser , computer science , programming language
Bragg reflection profiles in asymmetric diffraction using pseudo‐parallel‐beam geometry were examined and compared with the experimental data. For high collimation and strict monochromatization of the X‐ray beam, an Si(111) channel‐cut crystal was mounted on the incident‐beam side while a receiving slit or a Ge(111) flat‐crystal analyzer was used on the diffracted‐beam side. Profile intensities for CeO 2 powders, observed by symmetric θ –2 θ scanning and asymmetric 2 θ scanning at various fixed incident angles α (1–45°), were analyzed using individual‐profile‐fitting techniques. The variations of observed peak width and integrated intensity with α and 2 θ were in good agreement with the theory. Practically no peak broadening occurred for α > 10° while the peak width increased gradually with decreasing α below 10°. With a Ge(111) flat‐crystal analyzer, the peak broadening at α < 10° was suppressed below 0.05–0.07° in full width at half‐maximum.