Premium
Mapping of two‐dimensional lattice distortions in silicon crystals at submicrometer resolution from X‐ray rocking‐curve data. Erratum
Author(s) -
Nikulin A. Yu.,
Sakata O.,
Hashizume H.,
Petrashen P. V.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894006199
Subject(s) - lattice (music) , materials science , silicon , resolution (logic) , x ray , optics , crystallography , computational physics , condensed matter physics , molecular physics , physics , optoelectronics , chemistry , computer science , acoustics , artificial intelligence
In the paper by Nikulin, Sakata, Hashizume & Petrashen [ J. Appl. Cryst. (1994), 27 , 338–344], the lateral resolution in the two‐dimensional maps was evaluated incorrectly. The correct value should be calculated from the full angular range of an individual transverse scan, which gives 0.325 μm in the experimental condition described, one half the old value.