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Slits and high‐resolution X‐ray diffraction
Author(s) -
Van Der Sluis P.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894005911
Subject(s) - optics , diffraction , resolution (logic) , detector , reflection (computer programming) , reciprocal lattice , grating , physics , diffraction grating , beam (structure) , materials science , computer science , artificial intelligence , programming language
It is shown that, with proper use of an anti‐scatter slit in front of the detector, the signal‐to‐noise ratio of a symmetric high‐resolution X‐ray diffraction scan can be improved by a factor of ten. By the use of an asymmetric reflection with a high angle of incidence on the sample, the size of the diffracted beam can be reduced sufficiently to allow for two‐dimensional reciprocal‐space scans with a simple slit instead of a crystal assembly in front of the detector for enhanced resolution. By selection of the proper reflection, a resolution can be chosen that suits the application. Examples include a partially relaxed SiGe multilayer and a periodic surface grating.