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Using a two‐dimensional detector for X‐ray powder diffractometry
Author(s) -
Sulyanov S. N.,
Popov A. N.,
Kheiker D. M.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989400539x
Subject(s) - powder diffractometer , diffractometer , detector , planar , optics , reflection (computer programming) , materials science , powder diffraction , x ray , diffraction , intensity (physics) , sample (material) , scattering , phase (matter) , analytical chemistry (journal) , crystallography , physics , chemistry , computer science , computer graphics (images) , scanning electron microscope , chromatography , quantum mechanics , thermodynamics , programming language
Special software has been developed to calculate the intensity–scattering‐angle dependence. Powder diffraction patterns are obtained in a diffractometer with a two‐dimensional area detector. The detector used is a planar proportional chamber with fast delay lines. The optimum sample geometry for both the transmission and reflection method is considered. The application of the method for powders and for the investigation of phase transitions in liquid crystals is illustrated.