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A correction of the Seemann–Bohlin method for stress measurements in thin films
Author(s) -
Yu L.,
Sun H.,
Xu K.,
He J.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894004036
Subject(s) - stress (linguistics) , materials science , physics , condensed matter physics , philosophy , linguistics
The deviation of X‐ray data measured by the Seemann–Bohlin method from the predicted linear relationship is studied. A linear d versus sin 2 ψ relation can be achieved by a modification of the theory based on an average of the Voigt and Reuss models. However, because the Seemann–Bohlin method has to use low 2 θ values, it is intrinsically less accurate than the Bragg–Brentano method, particularly for low stress values.