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A new method for determining the normals to planar structures and their trace directions in transmission electron microscopy
Author(s) -
Liu Q.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889894002621
Subject(s) - planar , transmission electron microscopy , tilt (camera) , trace (psycholinguistics) , transmission (telecommunications) , electron microscope , optics , materials science , scanning transmission electron microscopy , conventional transmission electron microscope , electron , computer science , physics , geometry , computer graphics (images) , mathematics , telecommunications , linguistics , philosophy , quantum mechanics
With aid of a transmission‐electron‐microscope (TEM) double‐tilt holder, a method for determining the normals to planar structures and their traces in a TEM is developed. This method is considered to be simple and convenient when compared with other methods. The accuracy of the method for the determination of both the normals to planar structures and their traces is within 2°.