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Small‐angle X‐ray scattering in carbon fibers
Author(s) -
Gupta A.,
Harrison I. R.,
Lahijani J.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989400227x
Subject(s) - polyacrylonitrile , small angle x ray scattering , scattering , materials science , modulus , fiber , composite material , carbon fibers , optics , reflection (computer programming) , small angle scattering , intensity (physics) , polymer , physics , composite number , computer science , programming language
Small‐angle X‐ray scattering (SAXS) has been used as an analytical tool to study microporosity in polyacrylonitrile‐ (PAN‐) and pitch‐based carbon fibers. Microporosity in carbon fibers consists primarily of needle‐shaped voids whose long axes are oriented preferentially along the fiber axis. This preferred orientation is seen to be independent of the nature of the fiber precursor and is the major deciding factor in controlling the modulus of carbon fibers. As the modulus increases, the general trend for both PAN‐ and pitch‐based fibers is to move from a system consisting of many small pores to one with few larger pores. At very small angles, the steep rise in scattered intensity is due to reflection effects for PAN‐based fibers and multiple scattering effects from voids for pitch‐based fibers.