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High‐resolution diffraction at synchrotron sources: correction for counting losses
Author(s) -
Cousins C. S. G.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889893014141
Subject(s) - synchrotron , diffraction , resolution (logic) , powder diffraction , optics , materials science , synchrotron radiation , computational physics , physics , computer science , nuclear magnetic resonance , artificial intelligence
The operating schedules of synchrotron sources encourage relatively rapid data collection. Consequently, very high count rates may be met in powder diffraction experiments and high‐resolution single‐crystal studies. A rigorous treatment of the losses due to pulse pile‐up is given, as well as a discussion of possible losses due to windowing. The code for a simple correction algorithm is provided and used to illustrate the effect of losses on the intensities of two of the reflections in the powder spectrum of cimetidine.