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EDIM 93: a program for electron diffraction intensity measurement from photographic data
Author(s) -
Cheng T. Z.,
Wang J. F.,
Wan Z. H.,
Sha B. D.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889893012968
Subject(s) - intensity (physics) , electron diffraction , diffraction , optics , electron , physics , materials science , nuclear physics
A program, EDIM 93, for electron diffraction intensity measurement has been developed. The program processes the data from digitized electron diffraction films. The profile decomposition and summation methods are introduced for measuring the blackenings of diffraction spots. They are suitable for different distributions of the spots on the film. The program is applicable to periodic structures and to (3+1)‐ or (3+2)‐dimensional incommensurately modulated structures.