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X‐ray Berg–Barrett topography of the deformation substructure of stabilized zirconium oxide single crystals deformed at 1673 K
Author(s) -
Guiberteau F.,
Cumbrera F. L.,
DominguezRodriguez A.,
Fries E.,
Castaing J.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889893011379
Subject(s) - substructure , zirconium , materials science , slip (aerodynamics) , oxide , crystallography , microstructure , deformation (meteorology) , yttria stabilized zirconia , composite material , mineralogy , cubic zirconia , metallurgy , chemistry , ceramic , physics , thermodynamics , structural engineering , engineering
X‐ray Berg–Barrett topography has been used to check the nature of the slip systems that are activated during high‐temperature plastic deformation of single crystals and to follow the evolution of the microstructure with the strain. A study has been made of yttria fully stabilized zirconium oxide deformed by compression along the 〈001〉 direction at 1673 K. The {110} 〈10〉 slip system was activated.