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X‐ray texture analysis of thin films by the reflection method: intermediate regime in defocusing corrections
Author(s) -
Chateigner D.,
Germi P.,
Pernet M.
Publication year - 1994
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889893008611
Subject(s) - reflection (computer programming) , texture (cosmology) , optics , materials science , thin film , physics , computational physics , mathematical analysis , condensed matter physics , mathematics , image (mathematics) , nanotechnology , computer science , artificial intelligence , programming language
This paper gives the angular domains of validity for corrections of experimental data obtained from the texture analysis of thin films, multilayers and covered substrates by the Schulz reflection technique. The behaviours of defocusing curves versus material constants are given as examples and their effects on correction curves are shown. The correction formulas for characteristic types of multilayers are also deduced and are illustrated for one example.