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The half‐widths of Bragg intensity profiles measured with a triple‐crystal diffractometer at a synchrotron‐radiation source. I. Derivation of a simple expression for the full width at half‐maximum
Author(s) -
Rossmanith E.
Publication year - 1993
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989300439x
Subject(s) - diffractometer , synchrotron radiation , wavelength , crystal (programming language) , optics , intensity (physics) , radiation , synchrotron , divergence (linguistics) , physics , bragg's law , materials science , diffraction , scanning electron microscope , linguistics , philosophy , computer science , programming language
On the basis of the expressions given by Rossmanith [ Acta Cryst. (1992), A 48 , 596–610; (1993), A 49 , 80–91], a simple approximation is derived for the half‐widths of Bragg intensity profiles measured with a triple‐crystal diffractometer at a synchrotron‐radiation source. This new formula facilitates insight into the effects of four parameters – divergence, wavelength spread, mosaic spread and mosaic block size – on the widths of the profiles.