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A theoretical model for the correction of intensity aberrations in Bragg–Brentano X‐ray diffractometers – detailed description of the algorithm
Author(s) -
Matulis C. E.,
Taylor J. C.
Publication year - 1993
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892010781
Subject(s) - inverse square law , optics , diffractometer , intensity (physics) , transparency (behavior) , diffraction , physics , x ray , bragg peak , sample (material) , inverse , function (biology) , algorithm , computational physics , mathematics , computer science , geometry , classical mechanics , gravitation , beam (structure) , biology , thermodynamics , scanning electron microscope , computer security , evolutionary biology
A mathematical model for the correction of intensity aberrations in Bragg–Brentano X‐ray diffractometers is described. The model considers tube self‐absorption, the inverse square law, sample transparency, a slit passage function for the diffraction cones and axial displacement of the diffracting elements. A program called BBCCURV , based on the model, calculates an intensity correction curve for a given sample type (transparency) and diffractometer dimensions. The corrections are significant, especially for samples with low‐angle intensity data.