Premium
X‐ray reconstruction topography for observation of the orientation distribution in a single crystal
Author(s) -
Chikaura Y.,
Suzuki Y.
Publication year - 1993
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892010422
Subject(s) - orientation (vector space) , rotation (mathematics) , resolution (logic) , materials science , optics , x ray , distribution (mathematics) , scattering , crystal (programming language) , single crystal , silicon , physics , crystallography , geometry , nuclear magnetic resonance , chemistry , computer science , optoelectronics , artificial intelligence , mathematics , mathematical analysis , programming language
A microcomputer‐assisted reconstruction topography technique has been devised for observation of the distribution of subgrain orientations in a single crystal. The orientation at a specific location is computed, with data from X‐ray scattering topographs, by a microcomputer. The reconstruction topograph showing the orientation distribution consists of two topographs, one showing the rotation‐angle distribution around an axis and the other the orientation distribution of the rotation axis. The system capability has been demonstrated by observations of an iron‐3wt% silicon alloy with an orientational resolution of 2.0′ and a spatial resolution of less than 48 μm. Emphasis is placed on the fact that this is the first proposal for X‐ray topography involving spectroscopy.