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A new technique for the observation of X‐ray CTR scattering by using an imaging plate detector
Author(s) -
Shimura T.,
Harada J.
Publication year - 1993
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892010239
Subject(s) - scattering , wafer , detector , x ray , optics , synchrotron radiation , substrate (aquarium) , materials science , crystal (programming language) , synchrotron , anomalous scattering , single crystal , optoelectronics , chemistry , crystallography , physics , oceanography , computer science , programming language , geology
A new technique, using an Imaging Plate (IP) detector, was developed for the observation of X‐ray crystal truncation rod (CTR) scattering. The use of an IP detector in conjunction with a synchrotron‐radiation (SR) source is very effective for the observation of CTR scattering. The advantages and disadvantages of this technique are indicated by examples of the observation of CTR scattering from various samples: a naturally oxidized surface of an Si(111) wafer; MBE‐grown GaAs/AlAs/GaAs on GaAs(001) substrate; Al‐capped GaAs on an Si(111) substrate; and a cleavage NaCl(001) surface. It is also shown that it is possible to convert the observed intensity of the CTR scattering to an absolute scale if a stationary photograph is taken.