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X‐ray powder diffraction analysis of silver behenate, a possible low‐angle diffraction standard
Author(s) -
Huang T. C.,
Toraya H.,
Blanton T. N.,
Wu Y.
Publication year - 1993
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892009762
Subject(s) - diffraction , materials science , synchrotron , crystallite , x ray crystallography , calibration , silicon , analytical chemistry (journal) , optics , physics , metallurgy , chemistry , chromatography , quantum mechanics
Silver behenate, a possible low‐angle diffraction standard, was characterized using the powder diffraction technique. Diffraction patterns obtained with 1.54 Å synchrotron and Cu Kα radiations showed thirteen regularly spaced (00 l ) peaks in the range 1.5–20.0°2 θ . With the National Institute of Standards and Technology's standard reference material silicon as an internal standard, the long spacing of silver behenate was accurately determined from the profile‐fitted synchrotron diffraction peaks, with d 001 = 58.380 (3) Å. This result was in agreement with that obtained from the Cu Kα pattern. The profile widths of the silver behenate peaks were found to be consistently larger than those of the silicon peaks, indicating significant line broadening for silver behenate. The average crystallite size along the long‐spacing direction of silver behenate was estimated using the Scherrer equation, giving D avg = 900 (50) Å. Because silver behenate has a large number of well defined diffraction peaks distributed evenly in the 1.5–20.0°2 θ range, it is suitable for use as an angle‐calibration standard for low‐angle diffraction. However, care must be taken if silver behenate is to be used as a peak‐profile calibration standard because of line broadening.