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High‐temperature X‐ray diffraction: solutions to uncertainties in temperature and sample position
Author(s) -
Brown N. E.,
Swapp S. M.,
Bennett C. L.,
Navrotsky A.
Publication year - 1993
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989200877x
Subject(s) - diffraction , calibration , position (finance) , sample (material) , temperature measurement , thermal expansion , temperature gradient , materials science , x ray , temperature control , analytical chemistry (journal) , thermal , optics , chemistry , thermodynamics , physics , composite material , chromatography , meteorology , finance , quantum mechanics , economics
Methods of minimizing the uncertainties in temperature and position that are inherent in high‐temperature X‐ray powder diffraction measurements made using strip heaters are discussed, with particular reference to the Anton Paar HTK 10 heating stage. Modification of the strip geometry is recommended to largely eliminate temperature gradients across the sample area and the use of the strip heater as an internal standard is recommended to eliminate positional uncertainties and test temperature calibration. Data on the thermal expansion of Al 2 O 3 are used to evaluate the success of these procedures.