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Texture analysis by the Schulz reflection method: defocalization corrections for thin films
Author(s) -
Chateigner D.,
Germi P.,
Pernet M.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892006265
Subject(s) - texture (cosmology) , optics , thin film , materials science , reflection (computer programming) , substrate (aquarium) , sample (material) , penetration depth , physics , computer science , image (mathematics) , nanotechnology , geology , artificial intelligence , oceanography , thermodynamics , programming language
A new method is described for correcting experimental data obtained from the texture analysis of thin films. The analysis employed for correcting the data usually requires the experimental curves of defocalization for a randomly oriented specimen. In view of difficulties in finding non‐oriented films, a theoretical method for these corrections is proposed which uses the defocalization evolution for a bulk sample, the film thickness and the penetration depth of the incident beam in the material. This correction method is applied to a film of YBa 2 Cu 3 O 7 − δ on an SrTiO 3 single‐crystal substrate.