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Angle calculations for a vertical‐axis X‐ray diffractometer
Author(s) -
Hung H.H.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892005776
Subject(s) - diffractometer , diffraction , surface (topology) , scattering , optics , x ray , geometry , crystallography , x ray crystallography , physics , materials science , mathematics , chemistry , scanning electron microscope
A vertical z ‐axis‐type diffractometer is proposed and its relations between motor angles and Miller indices are derived. For diffraction geometry at a grazing incident angle, reflections should be incorporated in diffractometry algorithms. Further remarks are included on the subject of surface X‐ray scattering.