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Background correction of the SAXS intensities scattered by semicrystalline materials
Author(s) -
Meng C.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892004813
Subject(s) - small angle x ray scattering , crystallinity , scattering , amorphous solid , materials science , small angle scattering , phase (matter) , optics , crystallography , analytical chemistry (journal) , physics , chemistry , composite material , chromatography , organic chemistry
A new method of background correction of small‐angle X‐ray scattering (SAXS) intensities scattered by semicrystalline materials is proposed. The intensities scattered by the sample when in the amorphous state were taken as the background scattering. This method was applied to background correction of the SAXS intensities scattered by aged nylon 1010 and the width of the transition layer between crystalline and amorphous phase was determined to be 2.0 nm.