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Phase analysis of bulk samples using sample‐tilting X‐ray diffractometry
Author(s) -
Cong Q.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892004412
Subject(s) - diffractometer , diffraction , optics , bragg's law , x ray , reflection (computer programming) , x ray crystallography , sample (material) , bragg peak , phase (matter) , azimuth , surface (topology) , penetration depth , materials science , plane (geometry) , powder diffractometer , powder diffraction , physics , geometry , crystallography , chemistry , mathematics , computer science , scanning electron microscope , beam (structure) , quantum mechanics , thermodynamics , programming language
In the Bragg–Brentano X‐ray powder diffractometer, the sample‐tilting X‐ray diffraction (STD) technique probes a fixed depth of penetration from the sample surface. In this way, phase analysis can be carried out from the surface layers to the depth probed by the CBD (conventional Bragg–Brentano geometry X‐ray diffraction) method. In the present paper, after derivation of the diffracted intensity and the observed crystal‐plane azimuthal equations, attention is focused on investigations of the geometrical optics of X‐ray surface reflection by comparing the STD and CBD methods. Some examples are given to illustrate the applications of the STD technique for solving phase analyses and related problems.