Premium
LSI ‐ a computer program for simultaneous refinement of material structure and microstructure
Author(s) -
Lutterotti L.,
Scardi P.,
Maistrelli P.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889892001122
Subject(s) - anisotropy , microstructure , crystallite , computer program , rietveld refinement , convergence (economics) , diffraction , computer science , function (biology) , algorithm , materials science , optics , composite material , physics , programming language , metallurgy , evolutionary biology , economics , biology , economic growth
A computer program has been written to introduce profile analysis into the Rietveld method. The devised algorithm simultaneously refines both structural and microstructural parameters, also accounting for anisotropy in crystallite size and microstrain. Instead of using phenomenological relations to describe the trend of profile width and shape as a function of diffraction angle, a model based on the Warren–Averbach approach has been developed that permits extraction of more information from data, also achieving faster convergence.