Premium
The determination of unit‐cell parameters from Laue diffraction patterns using their gnomonic projections
Author(s) -
Carr P. D.,
Cruickshank D. W. J.,
Harding M. M.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889891012803
Subject(s) - diffraction , optics , unit (ring theory) , scaling , orientation (vector space) , wavelength , transmission (telecommunications) , x ray crystallography , crystal (programming language) , materials science , physics , crystallography , geometry , chemistry , mathematics , computer science , telecommunications , mathematics education , programming language
A method is described whereby the unit cell of a crystal and its orientation can be determined from a single Laue diffraction pattern (in transmission). The axial ratios and interaxial angles can be determined precisely, but the absolute scaling of the cell depends upon the accuracy with which the minimum wavelength for the experiment is known. Several examples are given.