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Estimation of d min , λ min and λ max from the gnomonic projections of Laue patterns
Author(s) -
Cruickshank D. W. J.,
Carr P. D.,
Harding M. M.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889891012797
Subject(s) - simple (philosophy) , projection (relational algebra) , synchrotron , estimation , physics , materials science , mathematics , geometry , optics , algorithm , engineering , systems engineering , philosophy , epistemology
The parameters d min and λ min , needed for the processing of synchrotron X‐ray Laue patterns, may be estimated by simple formulae from the sizes of the clear gaps surrounding prominent zone lines in gnomonic projections. The estimation of λ max is similarly considered. Examples are given.