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Planar defects in β‐iron disilicide (β‐FeSi 2 ) analyzed by transmission electron microscopy and modeling
Author(s) -
Zheng Y.,
Taccoen A.,
Petroff J. F.
Publication year - 1992
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889891010890
Subject(s) - transmission electron microscopy , stacking , crystallography , planar , materials science , electron microscope , lattice (music) , high resolution transmission electron microscopy , electron diffraction , electron tomography , diffraction , chemistry , nanotechnology , scanning transmission electron microscopy , optics , physics , computer science , computer graphics (images) , organic chemistry , acoustics
Microplanar defects were observed in β ‐iron disilicide by transmission electron microscopy. They were identified as (100)[011]/2 intrinsic stacking faults by means of electron diffraction patterns and observed in high‐resolution lattice images. A structural model of the faults is proposed here in setting the defect position at x = ¼ within the cell.