Premium
Complete determination of polarization state in the hard X‐ray region
Author(s) -
Ishikawa T.,
Hirano K.,
Kikuta S.
Publication year - 1991
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989100643x
Subject(s) - polarization (electrochemistry) , retarder , perpendicular , amplitude , optics , physics , spectrum analyzer , linear polarization , radiation , x ray , materials science , atomic physics , chemistry , geometry , mathematics , laser , composite material
A new method for complete determination of polarization state in the hard X‐ray region is described. The system consists of a perfect‐crystal phase retarder and a linear polarization analyzer. This method gives not only the amplitude ratio of mutually perpendicular electric vector components and the phase shift between them but also the proportion of unpolarized radiation.