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Investigation of the interface between polymers: a comparison of scattering and reflectivity techniques
Author(s) -
Stamm M.
Publication year - 1991
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889891000821
Subject(s) - neutron reflectometry , reflectometry , polymer , materials science , scattering , small angle x ray scattering , optics , neutron scattering , fourier transform , small angle neutron scattering , x ray reflectivity , phase (matter) , neutron , small angle scattering , reflectivity , physics , composite material , computer science , nuclear physics , time domain , quantum mechanics , computer vision
With the techniques of small‐angle X‐ray scattering (SAXS) and small‐angle neutron scattering (SANS) the interfacial region between polymers forming a two‐phase structure can be investigated. Various approaches are possible including the classical Porod analysis as well as the Fourier transform, sandwich or contrast‐matching techniques. Their application for the determination of the interface width and profile between polymer phases is discussed. As an alternative method X‐ray and neutron reflectometry from polymer layer systems has recently been introduced. It allows an accurate determination of various interfacial parameters provided a flat and smooth interface with sufficient contrast between the materials can be prepared. The techniques are compared and discussed with respect to the information which is obtained on the interfacial region of polymers.