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High‐resolution small‐angle X‐ray scattering camera for anomalous scattering
Author(s) -
Long G. G.,
Jemian P. R.,
Weertman J. R.,
Black D. R.,
Burdette H. E.,
Spal R.
Publication year - 1991
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889890009256
Subject(s) - scattering , synchrotron , materials science , optics , calibration , resolution (logic) , angular resolution (graph drawing) , small angle scattering , signal (programming language) , intensity (physics) , physics , mathematics , quantum mechanics , combinatorics , artificial intelligence , computer science , programming language
The design and operation of a new small‐angle X‐ray scattering instrument, optimized for high throughput at a synchrotron source, high angular and wavelength resolution, large sample cross‐sectional area, accurate energy tuning, excellent signal‐to‐noise ratio and harmonic rejection are presented. The principles of design and implementation are given, as are the details of primary calibration of absolute intensity and experimental desmearing. The instrument has been tested for application to anomalous‐scattering measurements near the chromium K edge. Preliminary results on samples of a heat‐treated steel are presented as a demonstration of the capability of this experiment to separate the microstructure evolution as a function of temperature of a chromium‐rich precipitate from the thermal behavior of other precipitates in the steel.