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A multimode high‐angular‐resolution powder diffractometer
Author(s) -
Kurahashi M.,
Honda K.,
Goto M.,
Inari Y.,
Katayama C.
Publication year - 1991
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889890008780
Subject(s) - monochromator , optics , diffractometer , goniometer , materials science , resolution (logic) , powder diffractometer , angular resolution (graph drawing) , full width at half maximum , bragg's law , spectrometer , beam (structure) , physics , diffraction , wavelength , scanning electron microscope , mathematics , combinatorics , artificial intelligence , computer science
A new powder diffractometer has been designed which can be used for various experimental geometries such as the long‐arm Bragg–Brentano method, Guinier method and parallel‐beam method. The X‐ray source, goniometer and scintillation counter are placed on rails so that the source‐to‐monochromator, monochromator‐to‐sample and sample‐to‐counter distances can be changed arbitrarily. A FWHM of 0.07° for the Kα 1 peak of the silicon 111 reflection was obtained by lengthening the counter arm in the Bragg‐Brentano method. Rather high angular resolution was achieved by the Guinier and parallel‐beam methods for organic samples having poor crystallinity and low absorption.