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Sub‐nanosecond X‐ray powder diffraction
Author(s) -
Woolsey N. C.,
Wark J. S.,
Riley D.
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889890008500
Subject(s) - nanosecond , materials science , diffraction , crystallite , optics , powder diffraction , x ray crystallography , full width at half maximum , laser , brightness , resolution (logic) , titanium , analytical chemistry (journal) , crystallography , chemistry , optoelectronics , physics , chromatography , artificial intelligence , computer science , metallurgy
The X‐rays emitted from a laser‐produced plasma have been used to obtain powder diffraction patterns with exposures of less than a nanosecond. The X‐rays were produced by focusing approximately 50 J of 0.53 μm laser light in a 600 ps (FWHM) pulse to a tight (~100 μm diameter) spot on a solid titanium target. The spectral brightness of the resonance line of the helium‐like titanium thus produced was sufficient to record diffraction from LiF powder in a single exposure using the Seemann–Bohlin geometry. These results indicate that time‐resolved measurements of the lattice parameters of polycrystalline materials can be made with sub‐nanosecond temporal resolution.