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Time‐resolved two‐dimensional observation of the change in X‐ray diffuse scattering from an alloy single crystal using an imaging plate on a synchrotron‐radiation source
Author(s) -
Iwasaki H.,
Matsuo Y.,
Ohshima K.,
Hashimoto S.
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889890007877
Subject(s) - synchrotron radiation , scattering , diffraction , synchrotron , optics , phase (matter) , x ray , intensity (physics) , crystal (programming language) , materials science , single crystal , physics , crystallography , chemistry , quantum mechanics , computer science , programming language
Through the high sensitivity of an area‐detector Imaging Plate and the high brilliance of synchrotron radiation, changes in two‐dimensional intensity distribution of X‐ray diffuse scattering from an AgZn single‐crystal having the B 2‐type structure were observed successively during the structural transition from the β ′ phase to the ζ phase. It has been shown in a series of patterns taken at a time interval of 600 s that a diffuse intensity sheet extending parallel to the (111) relplane gradually loses its intensity without a precursive modulation while weak diffraction spots from the nuclei of the ζ phase appear superimposed on the sheet with a definite positional relation to the diffraction spots from the β ′ phase. Promising aspects as well as the limits of the method applied to time‐resolved measurements of structural changes are discussed.