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A high‐resolution Weissenberg camera for X‐ray synchrotron radiation
Author(s) -
Hohlwein D.,
Axe J. D.
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889890004216
Subject(s) - streak camera , diffractometer , optics , synchrotron radiation , resolution (logic) , synchrotron , reciprocal lattice , materials science , reflection (computer programming) , germanium , x ray , crystal (programming language) , phase (matter) , physics , diffraction , laser , optoelectronics , computer science , scanning electron microscope , quantum mechanics , artificial intelligence , silicon , programming language
A photographic Weissenberg camera has been constructed which can be mounted on the 2 θ arm of a four‐circle diffractometer. At a distance of 0.5 m from the sample the 2 θ resolution for a 100 μm crystal is 0.2 mrad (0.01°), allowing a high‐resolution mapping of reciprocal space at a synchrotron source in an efficient way. As sample experimental results, a study is presented of the streak system around the 111 reflection of a perfect germanium crystal and the detection of a minute phase transformation in a single‐powder grain of a high‐ T c superconductor.