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Reduction of parasitic scattering in small‐angle X‐ray scattering by a three‐pinhole collimating system
Author(s) -
Wignall G. D.,
Lin J. S.,
Spooner S.
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889890001984
Subject(s) - scattering , collimated light , optics , small angle x ray scattering , small angle scattering , physics , resolution (logic) , materials science , laser , computer science , artificial intelligence
A series of experiments have been undertaken on the Oak Ridge National Laboratory (ORNL) 10 m small‐angle X‐ray scattering (SAXS) camera to provide quantitative data on the level of background (parasitic) scattering generated by different types of bevelled collimating slits. The addition of a third (guard) slit, positioned close to the sample, resulted in a reduction of over an order of magnitude in the parasitic background generated by the best two‐slit combination of collimating slits. This made it possible to reduce the size of the beamstop, permitting useful data to be collected down to a value of the scattering vector Q = 4 πλ −1 sin θ ≃ 3 × 10 −3 Å− 1 , where λ is the wavelength, and 2 θ is the angle of scatter. This permits the resolution of distances d ~ 2 π / Q up to 2000 Å.