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Design and performance of the multiwire area X‐ray diffractometer at the University of Virginia
Author(s) -
Sobottka S. E.,
Chandross R. J.,
Cornick G. G.,
Kretsinger R. H.,
Rains R. G.
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989000098x
Subject(s) - minicomputer , diffractometer , monochromator , fortran , crystal (programming language) , optics , orientation (vector space) , detector , computer science , physics , materials science , mathematics , geometry , programming language , scanning electron microscope , wavelength , operating system
A multiwire area diffractometer system for measuring X‐ray diffraction intensities has been developed and has been functioning as a Biotechnology Resource since 1984. The system consists of four flat multiwire area detectors and associated electronics, rotating‐anode X‐ray generator, goniostat, monochromator and crystal cooler. An HP 1000 minicomputer has been used to control the goniostat, to collect the data, and concurrently to process it. This computer is being replaced with a MicroVAX 3600. Computer programs, primarily written in Fortran 77, determine and update the orientation of the crystal, integrate the intensities of the reflections, and continually monitor the quality of the output. A statistical determination of systematic errors using lysozyme crystals showed that data accuracy is limited only by counting statistics for σ / above about 0.02. A compilation of papers published by users based on data obtained at the facility is presented.