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Double‐crystal X‐ray rocking‐curve peak splitting due to interference in triple‐layer epitaxic structures
Author(s) -
Cui Shufan,
Mai Zhenhong
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889889013415
Subject(s) - diffraction , formalism (music) , physics , optics , interference (communication) , x ray , intensity (physics) , crystal (programming language) , molecular physics , condensed matter physics , geometry , computational physics , crystallography , materials science , chemistry , mathematics , telecommunications , art , musical , channel (broadcasting) , computer science , visual arts , programming language
The origin of peak splitting in double‐crystal X‐ray rocking curves of epitaxic layer structures comprising two layers sandwiching another of different composition is examined both with Takagi–Taupin dynamical theory simulation and the semi‐kinematical model of Tapfer & Ploog. It is shown that the splitting occurs for specific phase differences between waves diffracted from the top and bottom layers. Thicknesses at which a minimum intensity occurs in the peak centre are calculated using the semi‐kinematical formalism and compared with the results of the full dynamical‐theory simulations. It is argued in the present paper that the semi‐kinematical theory can give a clear quantitative description but not an accurate quantitative result in analyzing complex epitaxic structures.