XTL ‐ SIZE : a computer program for crystal‐size‐distribution calculation from X‐ray diffraction line broadening | Zendy

Bonetto R. D. | Zendy; Viturro H. R. | Zendy; Alvarez A. G. | Zendy

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XTL ‐ SIZE : a computer program for crystal‐size‐distribution calculation from X‐ray diffraction line broadening

Author(s) -

Bonetto R. D.,

Viturro H. R.,

Alvarez A. G.

Publication year - 1990

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889889011775

Subject(s) - crystal (programming language) , perpendicular , line (geometry) , diffraction , computer program , x ray , plane (geometry) , distribution (mathematics) , crystallography , x ray crystallography , materials science , computer science , optics , computational physics , physics , chemistry , mathematics , geometry , mathematical analysis , programming language , operating system

A computer program has been written for the determination of crystal‐size distribution in a direction perpendicular to an ( hkl ) crystal plane, from a digitized XRD peak. It implements an information theory approach devised by Guérin, Alvarez, Rebollo Neira, Plastino & Bonetto [ Acta Cryst. (1986), A 42 , 30–35] and Alvarez, Bonetto, Guérin, Plastino & Rebollo Neira [ Powder Diffr. (1987), 2 , 220–224]. The program has a fully automated operation mode and owing to the very restricted amount of input data this program is specially suited to users with a limited knowledge of crystal‐size‐determination methods.

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