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Radiographic test of sample arrangement in synchrotron radiation
Author(s) -
LindegaardAndersen A.
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889889011635
Subject(s) - synchrotron radiation , radiography , optics , materials science , sample (material) , synchrotron , radiation , medical physics , physics , nuclear physics , thermodynamics
Low-temperature X-ray cryostats are normally heavy and bulky, which allows only a limited set of diffraction data to be collected from one crystal mounting. In order to obtain three-dimensional X-ray diffuse scattering intensity data from a thin flat single crystal below room temperature and above liquid-N2 temperature, a few improvements have to be introduced when constructing such a cryostat and mounting such a crystal on a cooling device. In partic-