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Measurement of anisotropic diffuse scattering with synchrotron radiation
Author(s) -
Rosshirt E.,
Frey F.,
Kupcik V.,
Miehe G.
Publication year - 1990
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889889010514
Subject(s) - synchrotron radiation , reciprocal lattice , synchrotron , diffuse reflection , optics , storage ring , anisotropy , high energy x rays , scattering , wavelength , physics , maxima , intensity (physics) , resolution (logic) , diffraction , beamline , art history , artificial intelligence , computer science , art , beam (structure) , performance art
Anisotropic diffuse scattering of the one‐dimensional conductor K‐hollandite has been measured at a synchrotron source and compared with measurements with a rotating anode. The intensity gain of more than one order of magnitude and the ability to adjust the wavelength provide the counting statistics in a few hours that are necessary for a quantitative analysis of diffuse phenomena. The main advantage of a synchrotron source is the high resolution throughout reciprocal space (low and high Q ). Thus, commensurate/incommensurate positions of diffuse layers may be distinguished, weak diffuse maxima become detectable and small peak shifts of diffuse modulations clearly visible. Correlation functions may be determined directly from the diffuse profiles without tedious resolution corrections. These features are essential for a dedicated instrument at a storage ring.