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XRAYL : a new powder diffraction profile fitting program
Author(s) -
Stewart J. M.,
Zhang Y.,
Hubbard C. R.,
Morosin B.,
Venturini E. L.
Publication year - 1989
Publication title -
journal of applied crystallography
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889889008770
Subject(s) - powder diffraction , diffraction , crystallography , materials science , optics , chemistry , physics