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A direct investigation of lattice relaxation at a crystal surface by optical transforms of surface profile images
Author(s) -
Harada J.,
Takata M.,
Miyatake H.,
Koyama H.
Publication year - 1989
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889889008630
Subject(s) - scattering , diffractometer , diffraction , materials science , optics , amorphous solid , wafer , crystal (programming language) , electron diffraction , relaxation (psychology) , condensed matter physics , molecular physics , crystallography , chemistry , scanning electron microscope , optoelectronics , physics , psychology , social psychology , programming language , computer science
Rod‐shaped scattering, referred to as crystal truncation rod (CTR) scattering in X‐ray diffraction, can also be observed in optical diffraction patterns obtained from the surface profile image of high‐resolution electron micrographs. The characteristics of the CTR scattering are shown to be in agreement with those observed by X‐ray scattering. With this technique, information about the lattice relaxation of the image of surfaces or interface boundaries observed in the electron microscope (EM) can be easily obtained and the lattice spacing of a GaAs crystal is shown to be shrunk at the interface boundary between the (001) surface and the amorphous oxide layer. This is precisely opposite to the effect observed for an Si (001) wafer surface. Several effects of surface modulation on CTR scattering are demonstrated using an optical diffractometer and masks of the f.c.c. lattice.