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X‐ray diffractometry of AlGaAs/GaAs superlattices and GaAs in the temperature range 5–295 K
Author(s) -
Clec'h G.,
Calvarin G.,
Auvray P.,
Baudet M.
Publication year - 1989
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889889004607
Subject(s) - superlattice , atmospheric temperature range , materials science , lattice constant , thermal expansion , condensed matter physics , x ray , crystallography , diffraction , chemistry , thermodynamics , optoelectronics , optics , composite material , physics
The temperature dependence of the lattice constants of Al x Ga 1 − x As/GaAs superlattices MBE‐grown on (001) oriented GaAs substrates was determined by X‐ray diffractometry. The thermal expansion coefficients of these materials become negative at low temperatures, like that of GaAs and other tetrahedrally bonded covalent solids. The temperature dependence of the stress in these structures was also studied; although its value increases as temperature decreases, strain remains elastic down to 5 K.