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Electronically focused time‐of‐flight powder diffractometers at the intense pulsed neutron source
Author(s) -
Jorgensen J. D.,
Faber J.,
Carpenter J. M.,
Crawford R. K.,
Haumann J. R.,
Hitterman R. L.,
Kleb R.,
Ostrowski G. E.,
Rotella F. J.,
Worlton T. G.
Publication year - 1989
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188988900289x
Subject(s) - time of flight , neutron , neutron source , materials science , resolution (logic) , detector , rietveld refinement , range (aeronautics) , optics , nuclear engineering , physics , nuclear physics , computer science , engineering , diffraction , artificial intelligence , composite material
Two time‐of‐flight powder diffractometers have operated at the Intense Pulsed Neutron Source (IPNS) since August 1981. These instruments use dedicated microcomputers to focus time‐of‐flight events so that data from different detectors can be summed into a single histogram. Thus, large multidetector arrays can be employed at any scattering angle from 12 to 157°. This design permits data to be collected over a uniquely wide range of d spacings while maintaining high resolution and count rates. The performance of the two instruments is evaluated by analyzing data from a standard Al 2 O 3 sample by the Rietveld method. These instruments provide the capability for moderate‐ to high‐resolution measurements with the duration of a typical run being a few hours.